Teseq NSG3060A Conducted Immunity Generator
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- One box solution system
- Surge voltage to 6.6 kV
- Ringwave voltage to 6.6 kV
- EFT/Burst to 4.8 kV / 1 MHz
- PQT to 16 A / 300 VAC & DC
- Easy to use 7“ color touch screen
- Parameters can be changed while test is running
- Wide range of optional test accessories
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More information
Description
Teseq NSG3060A
Teseq’s new NSG 3060A conducted immunity generator takes the proven, user-friendly design of the highly successful NSG 3000 series to a new level. This innovative design uses modular architecture to provide a versatile system that can be configured for basic testing needs and expanded to meet the needs of sophisticated test laboratories. Designed to fulfill requirements for CE mark and ANSI C62.41 testing, the NSG 3060A performs tests for Combination wave surge, Ring wave and Electrical Fast Transient (EFT) pulses as well as Power Quality Testing (PQT). Extensive expansion capabilities enable the system to be configured for a much broader range of applications. Using state of the art components, the self-contained modules set new standards with respect to switching and phase accuracy and exceed the existing standards’ requirements. With its powerful processors, the NSG 3060A can completely fulfill the unique coupling requirements specified by ANSI C62.41. This standard requires that the pulse amplitude be adjusted for the phase position of the pulse on the AC mains, and for the amplitude of the mains voltage. A 7” touch panel display with superb contrast and color is the most striking feature of the new NSG 3060A. For fast and efficient data entry, input devices include an integrated keyboard and a thumbwheel with additional keys for sensitivity adjustment. The user-friendly graphic display speeds test setup. Each parameter’s value is highly visible, and all settings can be quickly selected and modified with the generously sized touch input buttons. A stylus is not necessary, and ramp functions are programmed quickly and easily. Multi-step test procedures can be created and their sequence or parameter values changed easily. The users can make manual parameter changes using the thumbwheel while a test is under way, providing an effective and fast method for identifying critical threshold values. The Test Assistance (TA) function allows users to initiate standardized test with just a few “clicks” to achieve quick, reliable results in a development environment. The NSG 3060A has an Ethernet port for external PC control. The Windows-based control software simplifyes test programming and allows compilation of complex test sequences with diverse pulse types. Test reports can be generated during the test operation, allowing the operator to enter observations as the test progresses and increasing the efficiency of long-term tests.
Documents
Teseq NSG3060A
Teseq NSG3060A datasheetOptions
Video
Teseq NSG3060A
Teseq’s new NSG 3060A conducted immunity generator takes the proven, user-friendly design of the highly successful NSG 3000 series to a new level. This innovative design uses modular architecture to provide a versatile system that can be configured for basic testing needs and expanded to meet the needs of sophisticated test laboratories. Designed to fulfill requirements for CE mark and ANSI C62.41 testing, the NSG 3060A performs tests for Combination wave surge, Ring wave and Electrical Fast Transient (EFT) pulses as well as Power Quality Testing (PQT). Extensive expansion capabilities enable the system to be configured for a much broader range of applications. Using state of the art components, the self-contained modules set new standards with respect to switching and phase accuracy and exceed the existing standards’ requirements. With its powerful processors, the NSG 3060A can completely fulfill the unique coupling requirements specified by ANSI C62.41. This standard requires that the pulse amplitude be adjusted for the phase position of the pulse on the AC mains, and for the amplitude of the mains voltage. A 7” touch panel display with superb contrast and color is the most striking feature of the new NSG 3060A. For fast and efficient data entry, input devices include an integrated keyboard and a thumbwheel with additional keys for sensitivity adjustment. The user-friendly graphic display speeds test setup. Each parameter’s value is highly visible, and all settings can be quickly selected and modified with the generously sized touch input buttons. A stylus is not necessary, and ramp functions are programmed quickly and easily. Multi-step test procedures can be created and their sequence or parameter values changed easily. The users can make manual parameter changes using the thumbwheel while a test is under way, providing an effective and fast method for identifying critical threshold values. The Test Assistance (TA) function allows users to initiate standardized test with just a few “clicks” to achieve quick, reliable results in a development environment. The NSG 3060A has an Ethernet port for external PC control. The Windows-based control software simplifyes test programming and allows compilation of complex test sequences with diverse pulse types. Test reports can be generated during the test operation, allowing the operator to enter observations as the test progresses and increasing the efficiency of long-term tests.