Keithley 2510-AT Autotuning Tec SourceMeter
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- Channels - 1
- Max Current Source/Measure Range - 5A
- Max Voltage Source/Measure Range - 10V
- Power - 50 W
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Description
Keithley 2510-AT Autotuning Tec SourceMeter
The Models Keithley 2510 and 2510-AT TEC SourceMeter SMU instruments enhance Keithley’s CW (Continuous Wave) test solution for high speed LIV (light-current-voltage) testing of laser diode modules. These 50W bipolar instruments were developed in close cooperation with leading manufacturers of laser diode modules for fiberoptic telecommunications networks. Designed to ensure tight temperature control for the device under test, the Model 2510 was the first in a line of highly specialized instruments created for telecommunications laser diode testing. It brings together Keithley’s expertise in high speed DC sourcing and measurement with the ability to control the operation of a laser diode module’s Thermo-Electric Cooler or TEC (sometimes called a Peltier device) accurately.
Keithley instrumentation makes it easy to build a LIV (light-current-voltage) system to test laser diode modules cost-effectively.
- 2520 Pulse Laser Diode Test System: Synchronizing test system providing sourcing and measurement capability for pulsed and continuous LIV test.
- TEC SourceMeter SMUs, 2510 and 2510-AT: Ensure tight temperature control for laser diode modules by controlling its thermo-electric cooler.
Features | Benefits |
| Active temperature control | Prevents temperature variations that could cause the laser diode’s dominant output wavelength to change, leading to signal overlap and crosstalk problems. |
| 50W TEC Controller | Allows for higher testing speeds and a wider temperature setpoint range than other, lower-power solutions. |
| Fully digital P-I-D control | Provides greater temperature stability and can be easily upgraded with a simple firmware change. |
| Autotuning capability for the thermal control loop (2510-AT) | Eliminates the need to use trial-and-error experimentation to determine the best combination of P, I, and D coefficients. |
| Wide temperature setpoint range (–50°C to +225°C) and high setpoint resolution (±0.001°C) and stability (±0.005°C) | Covers most of the test requirements for production testing of cooled optical components and sub-assemblies. |
| Compatible with a variety of temperature sensor inputs—thermistors, RTDs, and IC sensors | Works with the types of temperature sensors most commonly used in a wide range of laser diode modules. |
| AC Ohms measurement function | Verifies the integrity of the TEC device. |
| 4-wire open/short lead detection for thermal feedback element | Eliminates lead resistance errors on the measured value, reducing the possibility of false failures or device damage. |
For more information:Tektronix
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Keithley 2510-AT Autotuning Tec SourceMeter
The Models Keithley 2510 and 2510-AT TEC SourceMeter SMU instruments enhance Keithley’s CW (Continuous Wave) test solution for high speed LIV (light-current-voltage) testing of laser diode modules. These 50W bipolar instruments were developed in close cooperation with leading manufacturers of laser diode modules for fiberoptic telecommunications networks. Designed to ensure tight temperature control for the device under test, the Model 2510 was the first in a line of highly specialized instruments created for telecommunications laser diode testing. It brings together Keithley’s expertise in high speed DC sourcing and measurement with the ability to control the operation of a laser diode module’s Thermo-Electric Cooler or TEC (sometimes called a Peltier device) accurately.
Keithley instrumentation makes it easy to build a LIV (light-current-voltage) system to test laser diode modules cost-effectively.
- 2520 Pulse Laser Diode Test System: Synchronizing test system providing sourcing and measurement capability for pulsed and continuous LIV test.
- TEC SourceMeter SMUs, 2510 and 2510-AT: Ensure tight temperature control for laser diode modules by controlling its thermo-electric cooler.
Features | Benefits |
| Active temperature control | Prevents temperature variations that could cause the laser diode’s dominant output wavelength to change, leading to signal overlap and crosstalk problems. |
| 50W TEC Controller | Allows for higher testing speeds and a wider temperature setpoint range than other, lower-power solutions. |
| Fully digital P-I-D control | Provides greater temperature stability and can be easily upgraded with a simple firmware change. |
| Autotuning capability for the thermal control loop (2510-AT) | Eliminates the need to use trial-and-error experimentation to determine the best combination of P, I, and D coefficients. |
| Wide temperature setpoint range (–50°C to +225°C) and high setpoint resolution (±0.001°C) and stability (±0.005°C) | Covers most of the test requirements for production testing of cooled optical components and sub-assemblies. |
| Compatible with a variety of temperature sensor inputs—thermistors, RTDs, and IC sensors | Works with the types of temperature sensors most commonly used in a wide range of laser diode modules. |
| AC Ohms measurement function | Verifies the integrity of the TEC device. |
| 4-wire open/short lead detection for thermal feedback element | Eliminates lead resistance errors on the measured value, reducing the possibility of false failures or device damage. |
For more information:Tektronix