Hioki ST5520 Insulation Tester
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Description
Hioki ST5520 Insulation Tester
The Hioki electrical safety testers are designed for insulation resistance and voltage withstand testing of electrical devices and components according to various safety standards. The ST5520 is the fastest insulation testers in the industry, delivering pass/fail assessment in as fast as 50 ms. 25 to 1000 V test voltage with 1 V resolution.
Key Features
• Rapidly assess in as fast as 50 ms
• Quick discharge of residual voltage
• Freely configurable test voltage (Set from 25 V to 1000 V, 1 V resolution)
• Contact check function (Prevents errors due to poor contact)
• Short-circuit check function (Stops potentional defects from reaching the market)
• Ideal for battery production lines
Basic specifications (Accuracy guaranteed for 1 year, Post-adjustment accuracy guaranteed for 1 year)
| Measurement items | Insulation resistance (Applied DC voltage method) |
|---|---|
| Testing voltage | (Measurement range: AUTO/MANUAL setting is possible)25 V ≤ V < 100 V (2.000/20.00/200.0 MΩ),100 V ≤ V < 500 V (2.000/20.00/200.0/2000 MΩ),500 V ≤ V ≤ 1000 V (2.000/20.00/200.0/4000 MΩ) |
| Basic accuracy | ±2 % rdg. ±5 dgt.25 V ≤ V < 100 V [0 to 20 MΩ]100 V ≤ V < 500 V [0 to 20 MΩ]500 V ≤ V ≤ 1000 V [0 to 200 MΩ] |
| Measurement speed | Fast: 30 ms/time, Slow: 500 ms/time (selectable) |
| Display | LCD (service life: 100,000 hours), 4-level backlight |
| Internal memory | Saved items: rated measurement voltage, comparator upper limit /lower limit values, test mode, beep sound to distinguish the result, test time, response time, resistance range, measurement speedMemory capacity: up to 10 items (can be saved/loaded) |
| Comparator setting | UPPER_FAIL: Measured value ≥ upper limit valuePASS: Upper limit value > measured value > lower limit valueLOWER_FAIL: Measured value ≤ lower limit value |
| Judgement process | Beep sound, PASS / U.FAIL/L. FAIL: light up on LED display, When UL_FAIL, U.FAIL / L.FAIL light up simultaneously, EXT.I/O output, judgement result can be obtained via RS-232C |
| Test duration | Definition of test duration: Test duration = Response time + Measurement timeFunction: Set the time from voltage application until pass/fail assessmentConfiguration range: 0.045 s to 999.999 s (0.001 s resolution) |
| Response time timer | After the start of the test, comparator judgment operation can be prohibited until a set interval from 0.005 sec. to 999.999 sec. (at 0.001 sec. resolution) has passed. |
| Analog output | DC +4 V f.s. |
| Interface | RS-232C (standard), External I/O (External control input, Judgment result)BCD output (ST5520-01 only) |
| Power supply | 100 to 240 V AC, 50/60 Hz, 25 VA max. |
| Dimensions and mass | 215 mm (8.46 in)W × 80 mm (3.15 in)H × 166 mm (6.54 in)D, 1.1 kg (38.8 oz) |
| Accessories | Instruction Manual ×1, Power cord ×1, EXT. I/O Connector ×1, Connector Cover ×1 |
Documents
Hioki ST5520 Insulation Tester
Hioki ST5520 DatasheetOptions
Hioki ST5520 Insulation Tester
| ST5520 | Built-in external I/O output |
|---|---|
| ST5520-01 | Built-in BCD output |
Video
Hioki ST5520 Insulation Tester
The Hioki electrical safety testers are designed for insulation resistance and voltage withstand testing of electrical devices and components according to various safety standards. The ST5520 is the fastest insulation testers in the industry, delivering pass/fail assessment in as fast as 50 ms. 25 to 1000 V test voltage with 1 V resolution.
Key Features
• Rapidly assess in as fast as 50 ms
• Quick discharge of residual voltage
• Freely configurable test voltage (Set from 25 V to 1000 V, 1 V resolution)
• Contact check function (Prevents errors due to poor contact)
• Short-circuit check function (Stops potentional defects from reaching the market)
• Ideal for battery production lines
Basic specifications (Accuracy guaranteed for 1 year, Post-adjustment accuracy guaranteed for 1 year)
| Measurement items | Insulation resistance (Applied DC voltage method) |
|---|---|
| Testing voltage | (Measurement range: AUTO/MANUAL setting is possible)25 V ≤ V < 100 V (2.000/20.00/200.0 MΩ),100 V ≤ V < 500 V (2.000/20.00/200.0/2000 MΩ),500 V ≤ V ≤ 1000 V (2.000/20.00/200.0/4000 MΩ) |
| Basic accuracy | ±2 % rdg. ±5 dgt.25 V ≤ V < 100 V [0 to 20 MΩ]100 V ≤ V < 500 V [0 to 20 MΩ]500 V ≤ V ≤ 1000 V [0 to 200 MΩ] |
| Measurement speed | Fast: 30 ms/time, Slow: 500 ms/time (selectable) |
| Display | LCD (service life: 100,000 hours), 4-level backlight |
| Internal memory | Saved items: rated measurement voltage, comparator upper limit /lower limit values, test mode, beep sound to distinguish the result, test time, response time, resistance range, measurement speedMemory capacity: up to 10 items (can be saved/loaded) |
| Comparator setting | UPPER_FAIL: Measured value ≥ upper limit valuePASS: Upper limit value > measured value > lower limit valueLOWER_FAIL: Measured value ≤ lower limit value |
| Judgement process | Beep sound, PASS / U.FAIL/L. FAIL: light up on LED display, When UL_FAIL, U.FAIL / L.FAIL light up simultaneously, EXT.I/O output, judgement result can be obtained via RS-232C |
| Test duration | Definition of test duration: Test duration = Response time + Measurement timeFunction: Set the time from voltage application until pass/fail assessmentConfiguration range: 0.045 s to 999.999 s (0.001 s resolution) |
| Response time timer | After the start of the test, comparator judgment operation can be prohibited until a set interval from 0.005 sec. to 999.999 sec. (at 0.001 sec. resolution) has passed. |
| Analog output | DC +4 V f.s. |
| Interface | RS-232C (standard), External I/O (External control input, Judgment result)BCD output (ST5520-01 only) |
| Power supply | 100 to 240 V AC, 50/60 Hz, 25 VA max. |
| Dimensions and mass | 215 mm (8.46 in)W × 80 mm (3.15 in)H × 166 mm (6.54 in)D, 1.1 kg (38.8 oz) |
| Accessories | Instruction Manual ×1, Power cord ×1, EXT. I/O Connector ×1, Connector Cover ×1 |
Hioki ST5520 Insulation Tester
Hioki ST5520 DatasheetHioki ST5520 Insulation Tester
| ST5520 | Built-in external I/O output |
|---|---|
| ST5520-01 | Built-in BCD output |