VeEX TLS-1000 Tunable Laser Source
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Tunable Laser Source OLTSThe VeEX TLS-1000 Family of Tunable Laser Sources is designed to provide a new level of high performance testing and increased test efficiency by incorporating fastest swept-wavelength test ≥ 200 nm/s while reducing cost of ownership
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Description
VeEX TLS-1000 Tunable Laser Source
KEY FEATURES
- Fast Wavelength Tuning, high power output, and high power stability
- Output Power Stability ± 0.004 dB
- Single or optional dual port operation - Single Port +20 mW, dual port 10 mW/port
- Internal wavelength reference
- Variable linewidth
- Laser Safety Class 1M
- Fixed or Interchangeable optical adapters
- System control and communication provided via RS232C and USB interfaces
- Operating Modes:
- Maximum Sweep Speed 200 nm/s
- Superior Noise Level (ASE) ≥ 70 dB
- 2U chassis
- Trigger in/out
KEY APPLICATIONS
- Optical coating monitoring
- Spectral Measurements for passive components
- Fiber optic transmission testing
- Optical Transceiver testing
- Optical Amplifier testing
- Optical Alignment testing
- Fiber optic Sensors
- Spectroscopy
- Interferometry
- Photonic material characterization
Documents
VeEX TLS-1000 Tunable Laser Source
TLS-1000_D05-00-132P_B00Options
Video
VeEX TLS-1000 Tunable Laser Source
KEY FEATURES
- Fast Wavelength Tuning, high power output, and high power stability
- Output Power Stability ± 0.004 dB
- Single or optional dual port operation - Single Port +20 mW, dual port 10 mW/port
- Internal wavelength reference
- Variable linewidth
- Laser Safety Class 1M
- Fixed or Interchangeable optical adapters
- System control and communication provided via RS232C and USB interfaces
- Operating Modes:
- Maximum Sweep Speed 200 nm/s
- Superior Noise Level (ASE) ≥ 70 dB
- 2U chassis
- Trigger in/out
KEY APPLICATIONS
- Optical coating monitoring
- Spectral Measurements for passive components
- Fiber optic transmission testing
- Optical Transceiver testing
- Optical Amplifier testing
- Optical Alignment testing
- Fiber optic Sensors
- Spectroscopy
- Interferometry
- Photonic material characterization