Teseq NSG 4070D Comprehensive RF Conducted Immunity Solution
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- Integrated signal generator 4 kHz to 1 GHz
- 3 external power meter inputs 4 kHz to 1 GHz
- Multiple EUT monitoring options
- 5,7“ TFT color display
- Internal, menu-based control software
- Basic remote control soware and report generator included
- Optically decoupled remote control
- Suitable for various RF conducted EMC tests: Industrial, Automotive, Military, Avionics, and Medical.
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Description
The NSG 4070D by Teseq (Ametek CTS) is a compact and versatile EMC immunity test system, featuring an integrated signal generator, power amplifiers, and RF power meter. It provides precise and efficient electromagnetic susceptibility testing for a wide range of applications, including industrial, automotive, medical, and consumer electronics.
The heart of the NSG 4070D is its integrated signal generator, producing sinusoidal signals from 4 kHz to 1 GHz, with levels from -60 dBm to +10 dBm. It includes an internal modulator for amplitude and pulse modulation (AM and PM), both adjustable within and beyond standard specifications.
The NSG 4070D includes a modular power amplifier system tailored to specific testing needs:
- Testing in the frequency range from 150 kHz to 230 MHz (e.g., IEC 61000-4-6 and ISO 7367-4 pulse A) with power models of 50 W and 100 W.
- Testing in the frequency range from 4 kHz to 400 MHz (e.g., ISO 11452-4, MIL 461- CS114) with 50 W and 100 W models.
During the testing, the Equipment Under Test (EUT) can be monitored in different ways. This monitoring can be logged in the result file and can be used to abort the test. The NSG 4070D offers multiple monitoring options for:
- TTL Inputs/Outputs: For seamless integration with external monitoring equipments.
- Optical Monitoring: Detects the status of light indicator for real-time feedback.
- Digital and Analog monitoring: for up detecting the input voltage as high as 24 V
The NSG 4070 offers pre-programmed test routines for easy setup, enabling quick selection of standard tests. Users can modify and save custom routines, eliminating the
need to create them from scratch.
The NSG 4070's vector programming mode enables precise control of frequency and level parameters for each test vector, with adjustable start and stop conditions for complex test.
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The NSG 4070D by Teseq (Ametek CTS) is a compact and versatile EMC immunity test system, featuring an integrated signal generator, power amplifiers, and RF power meter. It provides precise and efficient electromagnetic susceptibility testing for a wide range of applications, including industrial, automotive, medical, and consumer electronics.
The heart of the NSG 4070D is its integrated signal generator, producing sinusoidal signals from 4 kHz to 1 GHz, with levels from -60 dBm to +10 dBm. It includes an internal modulator for amplitude and pulse modulation (AM and PM), both adjustable within and beyond standard specifications.
The NSG 4070D includes a modular power amplifier system tailored to specific testing needs:
- Testing in the frequency range from 150 kHz to 230 MHz (e.g., IEC 61000-4-6 and ISO 7367-4 pulse A) with power models of 50 W and 100 W.
- Testing in the frequency range from 4 kHz to 400 MHz (e.g., ISO 11452-4, MIL 461- CS114) with 50 W and 100 W models.
During the testing, the Equipment Under Test (EUT) can be monitored in different ways. This monitoring can be logged in the result file and can be used to abort the test. The NSG 4070D offers multiple monitoring options for:
- TTL Inputs/Outputs: For seamless integration with external monitoring equipments.
- Optical Monitoring: Detects the status of light indicator for real-time feedback.
- Digital and Analog monitoring: for up detecting the input voltage as high as 24 V
The NSG 4070 offers pre-programmed test routines for easy setup, enabling quick selection of standard tests. Users can modify and save custom routines, eliminating the
need to create them from scratch.
The NSG 4070's vector programming mode enables precise control of frequency and level parameters for each test vector, with adjustable start and stop conditions for complex test.