Tektronix TICP025 IsoVu™ Isolated Current Probe

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Variations: 250 MHz

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  • Bandwidth:
    250 MHz
  • Differential Voltage:
    ±0.5V  (1x Tip)
    ±5V  (10x Tip)
    ±50V  (100x Tip)
  • Common Mode Voltage:
    1.8 kV Pollution degree 1
    1000 V CAT II
  • Common Mode Rejection Ratio:
    140 dB at DC
    90 dB at 1 MHz (1x Tip)

Discover the possibilities

More information

Make more accurate dynamic shunt-based current measurements with TICP Series current probes. High bandwidth, flexible ranges, complete galvanic isolation and extremely low noise enable you to go beyond traditional limits – ideal for low noise measurements on current shunts in floating sections of power circuits.

 


 

A Breakthrough in Oscilloscope Current Measurements

TICP current probes enable measurements from DC to hundreds of MHz when paired with high-performance shunts or CVRs.  Choose from three models to fit your application and budget.

Complete RF isolation between the probe tip and the scope eliminates ground loops and dramatically reduces common mode noise.

Low attenuation, 50 Ω input impedance, and shielded tips ensure a low noise contribution.

  • Three bandwidths: 250 MHz, 500 MHz, 1 GHz
  • Up to 90 dB CMRR @ 1 MHz
  • Noise contribution < 4.7 nV/√Hz (<150 µV at 1 GHz)

Watch the overview video to learn more

 


 

Gain New Insights into SiC and GaN Power Converters

For measuring fast-changing currents in wide bandgap switching devices, shunt probes can deliver more bandwidth than clamp-on probes. IsoVu isolation eliminates ground loops, enables measurements on high-voltage circuits, and provides extremely high CMRR. This makes TICP probes ideal for current measurements on shunts and CVRs on high-side SiC and GaN switching FETs.

  • 250 MHz, 500 MHz, or 1 GHz bandwidth
  • 1800 VRMS Common mode voltage
  • Up to 90 dB CMRR @ 1 MHz
  • 1000 V CAT II Safety rating

Combine with IsoVu Voltage Probes for a low-noise picture of switching performance.

Double Pulse Testing on High-Side FETs

 


 

Measure Current Draw in Nanoseconds and Microamps in Low Power Designs

Accurately measuring low-level, dynamic currents can be critical for optimizing power management in IoT and mobile devices. With TICP probes and shunts, along with your oscilloscope, you’ll be able to see current consumption during specific system activities and transitions from sleep to active states, correlated with memory accesses and I/O.

  • Bandwidth up to 1 GHz
  • Noise contribution < 4.7 nV/√Hz (<150 µV at 1 GHz)
  • Easily measure 12, 24 or 48 V rails, or higher

Combine with Power Rail Probes for multi-rail analysis of power distribution networks.

 


 

Minimize Connection Hassles

TICP probes and tips are designed to minimize connection hassles while limiting noise. Tips are designed to bend easily to reduce strain on connections and promote easy reliable connections to your DUT.

  • Tips terminate in shielded, high-bandwidth MMCX connectors
  • Use with off-the-shelf adapters for SMA or BNC connectors
  • Adapt to 25 mil square pins for connection to on-board shunts and test points
  • Included bipod and tripod adapters for stability

 


 

Seamless Integration with 4, 5 and 6 Series MSO Oscilloscopes

4, 5 and 6 Series MSO oscilloscopes are known for their advanced power analysis capabilities. IsoVu current probes are designed to work seamlessly with these instruments. The TekVPITM probe interface powers the probe, and automatically detects the probe and tip, allowing you to adjust probe parameters from the scope user interface. This also enables test automation using the oscilloscopes’ programming commands.