Tektronix TAP1500L 1.5 GHz Active Probe

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  • Attenuation - 10X
  • Bandwidth - 1.5 GHz
  • Input Impedance - 1 MΩ || ≤ 1 pF
  • Maximum Voltage - ± 8 V

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More information

A modification to the existing TAP1500 active single-ended probe, this new version features a cable that is 5.7 meters longer than the original. The TAP1500L addresses a critical need for engineers: the ability to perform automated tests with greater flexibility and safety. Fitting for Flying Probe end-users and manufacturers, the device helps to effectively and safely conduct testing while allowing greater flexibility for customers to position test stations for unique needs, with no loss in performance. This probe is an investment from Tektronix in ensuring success of customers performing automated test.

 


 

Key features

  • Outstanding electrical performance
    • ≥1.5 GHz probe bandwidth
    • <267 ps rise time
    • ≤1 pF input capacitance
    • 1 MΩ input resistance
    • -8 V to +8 V input dynamic range
    • -10 V to +10 VDC input offset range
  • Versatile mechanical performance
    • Small compact probe head for probing small geometry circuit elements
    • DUT attachment accessories enable connection to SMDs as small as 0.5 mm pitch
    • Robust design for reliability
  • Easy to use
    • Connects directly to oscilloscopes with the TekVPI™ probe interface
    • Provides automatic units scaling and readout on the oscilloscope display
    • Easy access to oscilloscope probe menu display for probe status/diagnostic information, and to control probe DC offset
    • Remote GPIB/USB probe control through the oscilloscope
  • Applications
    • High-speed Digital Systems Design
    • Component Design and Characterization
    • Manufacturing Engineering and Test
    • Educational Research
    • Signals with Voltage Swings up to 16 V

 


 

1.5 GHz active probes for TekVPI™ probe interface

Specifically designed for use and direct connection to oscilloscopes with the TekVPI™ probe interface, the TAP1500 Active FET probe achieves high-speed signal acquisition and measurement fidelity by solving three traditional problems:

  • Lower DUT loading effects with ≤1 pF input capacitance and 1 MΩ input resistance
  • Versatile DUT connectivity for attaching to small SMDs
  • Preserves instrument bandwidth at the probe tip for ≤1 GHz oscilloscopes