Keithley 2657A 3000V, 120mA, 200W SourceMeter

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  • Source or sink up to 180W of DC or pulsed power (±3000V@20mA, ±1500V@120mA)
  • 1fA low current resolution
  • Dual 22-bit precision ADCs and dual 18-bit 1?s per point digitizers for high accuracy and high speed transient capture
  • Fully TSP® compliant for easy system integration with Series 2600B System SourceMeter models
  • Combines a precision power supply, current source, DMM, arbitrary waveform generator, V or I pulse generator, electronic 18-bit load, and trigger controller – all in one instrument
  • Includes TSP® Express characterization software, LabVIEW® driver, and Keithley’s Test Script Builder software development environment

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Keithley 2657A 3000V, 120mA, 200W SourceMeter

The Model 2657A is a high voltage, high power, low current source measure unit (SMU) instrument that delivers unprecedented power, precision, speed, flexibility, and ease of use to improve productivity in R&D, production test, and reliability environments. The Model 2657A is designed specifically for characterizing and testing high voltage electronics and power semiconductors, such as diodes, FETs, and IGBTs, as well as other components and materials in which high voltage, fast response, and precise measurements of voltage and current are required. The Model 2657A offers the highest power and best low current performance in the industry. It is supported by the industry’s most powerful parametric characterization software platforms to grow with you as your applications evolve.
The Model 2657A offers highly flexible, four-quadrant voltage and current source/load coupled with precision voltage and current meters. It can be used as a:

  • Semiconductor characterization instrument
  • V or I waveform generator
  • V or I pulse generator
  • Precision power supply with V and I readback
  • True current source
  • Digital multimeter (DCV, DCI, ohms, and power with 6½-digit resolution)
  • Precision electronic load




Highly flexible, four-quadrant voltage and current source/load coupled with precision voltage and current metersOffers best-in-class performance with 6½-digit resolution.
Source or sink (2651A) up to 2,000W of pulsed power (±40V, ±50A) or up to 200W of DC power (±10V@±20A, ±20V@±10A, ±40V@±5A); easily connect two units (in series or parallel) to create solutions up to ±100A or ±80VSupports characterization/testing of power semiconductors, HBLEDs, optical devices, solar cells, and GaN, SiC, and other compound materials and devices. Applications include semiconductor junction temperature characterization; high speed, high precision digitization; electromigration studies; and high current, high power device testing.
Source or sink (2657A) up to 180W of DC or pulsed power (±3000V@20mA, ±1500V@120mA)Provides the high voltage required for power semiconductor device characterization and testing, including GaN, SiC, and other compound materials and devices, breakdown and leakage testing to 3kV, and characterization of sub-millisecond transients.
Built-in web browser based softwareAllows for remote control through any browser, on any computer, from anywhere in the world.
Choice of digitizing or integrating measurement modesSupports characterizing transient and steady-state behavior precisely, including rapidly changing thermal effects.
TSP (Test Script Processing) technologyAllows easy system integration with Model 2657A and Series 2600B models.
TSP-Link channel expansion busEnables multiple 2651As and 2657As and selected Series 2600B SMU instruments to be combined to form an integrated system with up to 32 channels.
Compatible with Model 8010 High Power Device Test Fixture and Model 8020 High Power Interface PanelProvides safe and easy connections for testing high power devices at either the packaged part or wafer level.
Free Test Script Builder software toolHelps you create, modify, debug, and store TSP test scripts.
Optional ACS Basic semiconductor component characterization softwareMaximizes productivity when performing packaged part characterization during development, quality verification, or failure analysis.