Anritsu MP2100B Bit Error Rate Tester

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BERTWave™ MP2100BBuilt-in 4ch BERT and sampling oscilloscopeSimultaneous 4ch Bit Error Rate (BER) measurementsHigh-quality waveform PPG (1 ps rms Jitter)High-input sensitivity (10 mVp-p minimum input sensitivity)High-speed Eye Mask test and Eye pattern analysis at 150 ksample/s max.Supports differential signal BER measurement, Eye Mask test and Eye pattern analysisUp to six built-in Bessel filters for full-featured application supportCompact (18 cm deep) test set for optical module evaluationSimultaneous measurement of BER, Jitter, Eye pattern and Eye MaskSupports WDP measurementsCalculates optimum values for sampling simultaneously with equalizer and emphasis values to display Eye PatternSimultaneous Eye Pattern, Eye Mask and Jitter measurements of simulated waveform

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Anritsu MP2100B Bit Error Rate Tester

The BERTWave MP2100B is an all-in-one bit error rate test set with built-in BERT and sampling oscilloscope supporting evaluation of optical modules, including BER measurements, Eye Mask tests, Eye pattern analyses, etc.

The BERTWave MP2100B BERT function supports BER measurements at speeds ranging from 125 Mbit/s to 12.5 Gbit/s; its built-in 4ch BERT option makes it easy to configure test systems for multichannel modules, such as QSFP+ and AOC. Further, in addition to supporting BER measurements for differential signals, it also supports Eye Mask and Eye pattern Measurements.

The BERTWave MP2100B sampling oscilloscope has a bandwidth of 25 GHz (typ.) for electrical interfaces and a bandwidth of 9 GHz (typ.) for optical interfaces. In addition, up to six optional Bessel filters can be built-in for measuring optical signals using the scope. Using these filters, MP2100B supports extinction ratio measurements, Eye Mask tests and Eye pattern analyses for various applications. Further, the scope has a Fast Sampling Mode to secure the fastest high-speed measurements; sampling speeds of up to 150 ksample/s are supported by Fast Sampling Mode, which is 1.5 times faster than legacy models and supports time-saving high-speed Eye Mask tests and Eye pattern analyses.