





VeEX MTX642 Dual 400G Portable Test Set
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- True All-in-One, from 10M to 400GE
- Dual test ports for all interfaces
- Up to two independent tests
- Best-in-class intelligent cooling system
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400G Down to 10M Ethernet Testing
Compact 2x400GE multi-service handheld test set
VeEX MTX642 is the industry’s most compact dual 400GE portable test solution. With a 7-inch capacitive LCD and intuitive user interface, it is the fastest to operate, and most flexible 400GE solution. From boot-up to dual 400GE testing in under two minutes, the MTX642 is truly in a class of its own. The MTX642 supports the latest tests interfaces, RJ45 to QSFPDD, commonly found in the Core, Metro, Datacenter, and Access Network applications.
The MTX642 is an advanced handheld test solution designed with dual test engines, enabling comprehensive support for both legacy and next-generation optical transceiver form factors across a broad spectrum of applications, including Transport, Core, Metro, P2P links, DCI, transceivers, AOC, AEC, ACC, DAC, and breakout testing. It also offers native RJ45 (copper) interface support for rates up to 10G BASE-T, addressing the requirements of modern multi-gigabit access services.
Optimized for fast field operations, the MTX642 goes from power-up to dual 400GE testing in under two minutes, making it exceptionally suited for time-critical tasks, such as troubleshooting transceiver, network equipment verification, installation, maintenance, and commissioning tasks. With the industry-wide adoption of 400GE, its intuitive graphical user interface (GUI) and smart, predefined configurations streamline the test process, empowering users to perform advanced testing immediately with application-specific test applications.
Representing a new standard in high-speed Ethernet (HSE) testing, the MTX642 is designed for user accessibility, minimizing onboarding time and simplifying complex test procedures for operators at any experience level. As a result, it is an essential tool for professionals engaged in high-speed Ethernet deployment.
- 2x400GE concurrent testing capabilities
- Offers dual ports for all pluggable optics form factors, required for AOC/DAC, fan-out and wrap-around tests (from 10M to 400GE)
- Native PAM4 hardware for best-in-class signal integrity (no adapters required)
- Supports testing for all common form factors, including QSFP-DD, QSFP56, SFP-DD, and SFP56 transceivers, DACs, AOCs, network equipment and 400GE links
- Wide range of supported 400GE interfaces, including 400GBASE-SR8, FR8, LR8, DR4, FR4, LR4, CR8, CR4 and 400ZR/ZR+
- Complete industry-standard Ethernet for Layers 2, 3 and 4
- Stateful TCP Performance Test up to 400GE
- I2C/MDIO registers Read and Write
- Per-lane PAM4 host pre-emphasis settings
- Signal integrity check with FEC codeword symbol errors distribution and Skew
- Transceiver power consumption monitoring (voltage, current) and variable voltage supply
- Internal and external (cage) QSFP-DD temperature monitoring with overheating protection
- Battery operation improves mobility and efficiency
- High-efficiency intelligent cooling system
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Muligheder
Video
VeEX RXT-6402 Advanced Dual 400G Multi-service Test Module
400G Down to 10M Ethernet Testing
Compact 2x400GE multi-service handheld test set
VeEX MTX642 is the industry’s most compact dual 400GE portable test solution. With a 7-inch capacitive LCD and intuitive user interface, it is the fastest to operate, and most flexible 400GE solution. From boot-up to dual 400GE testing in under two minutes, the MTX642 is truly in a class of its own. The MTX642 supports the latest tests interfaces, RJ45 to QSFPDD, commonly found in the Core, Metro, Datacenter, and Access Network applications.
The MTX642 is an advanced handheld test solution designed with dual test engines, enabling comprehensive support for both legacy and next-generation optical transceiver form factors across a broad spectrum of applications, including Transport, Core, Metro, P2P links, DCI, transceivers, AOC, AEC, ACC, DAC, and breakout testing. It also offers native RJ45 (copper) interface support for rates up to 10G BASE-T, addressing the requirements of modern multi-gigabit access services.
Optimized for fast field operations, the MTX642 goes from power-up to dual 400GE testing in under two minutes, making it exceptionally suited for time-critical tasks, such as troubleshooting transceiver, network equipment verification, installation, maintenance, and commissioning tasks. With the industry-wide adoption of 400GE, its intuitive graphical user interface (GUI) and smart, predefined configurations streamline the test process, empowering users to perform advanced testing immediately with application-specific test applications.
Representing a new standard in high-speed Ethernet (HSE) testing, the MTX642 is designed for user accessibility, minimizing onboarding time and simplifying complex test procedures for operators at any experience level. As a result, it is an essential tool for professionals engaged in high-speed Ethernet deployment.
- 2x400GE concurrent testing capabilities
- Offers dual ports for all pluggable optics form factors, required for AOC/DAC, fan-out and wrap-around tests (from 10M to 400GE)
- Native PAM4 hardware for best-in-class signal integrity (no adapters required)
- Supports testing for all common form factors, including QSFP-DD, QSFP56, SFP-DD, and SFP56 transceivers, DACs, AOCs, network equipment and 400GE links
- Wide range of supported 400GE interfaces, including 400GBASE-SR8, FR8, LR8, DR4, FR4, LR4, CR8, CR4 and 400ZR/ZR+
- Complete industry-standard Ethernet for Layers 2, 3 and 4
- Stateful TCP Performance Test up to 400GE
- I2C/MDIO registers Read and Write
- Per-lane PAM4 host pre-emphasis settings
- Signal integrity check with FEC codeword symbol errors distribution and Skew
- Transceiver power consumption monitoring (voltage, current) and variable voltage supply
- Internal and external (cage) QSFP-DD temperature monitoring with overheating protection
- Battery operation improves mobility and efficiency
- High-efficiency intelligent cooling system