Tektronix MSMU60-2 SMU Modul
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- 2 SMU-kanaler pr. modul, 6 kanaler pr. hovedramme
- Op til 60V og op til 1,5 A pr. kanal
- Tilbyder 4-kvadrant spænding/strømkilde og måler for hver kanal med 6½-digit måleresolution ned til 100 femtoamps
- Integrerede 1 MSa/s ADC'er til både spændings- og strømmeasurements ved hjælp af hurtige sample rates
- Op til 6 V mellem force og sense, hvilket giver brugerne mere fleksibilitet i kabling og testopsætning
- Brugervalgt auto-sense modstand forhindrer overdreven spænding ved Force Hi, hvis der er kontaktfejl
- Asymmetrisk Compliance: Konfigurer uafhængige positive og negative grænseværdier
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The Tektronix MP5000 Modular Precision Test System accommodates all your sourcing needs within a 1U rack space. This top-tier automated test equipment (ATE) optimizes rack space by incorporating multiple source measure units (SMUs) and power supplies with adaptable module options. Featuring three slots and dual-channel modules, it offers up to six parallel channels. For higher channel count applications, TSP-Link™ provides a solution to connect mainframes in a master-subordinate configuration, effectively allowing them to function as one unit. This facilitates the creation of an optimized source and measurement system suitable for a wide range of applications, from validating design and debugging to complex parallel test systems used in ATE.
Customers can mix and match module configurations to optimize cost, throughput, and accuracy. For applications where low current measurements and sinking capabilities aren’t required, power supplies can be a cost-effective solution. For applications in which true current sourcing and high-speed measurements are required, consider an SMU module. The system supports a wide array of applications, and its high-density design conserves valuable rack space and reduces cost per channel. It’s engineered to deliver fast throughput for high-channel parallel testing, saving both cost and time for production and validation test users.
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The Tektronix MP5000 Modular Precision Test System accommodates all your sourcing needs within a 1U rack space. This top-tier automated test equipment (ATE) optimizes rack space by incorporating multiple source measure units (SMUs) and power supplies with adaptable module options. Featuring three slots and dual-channel modules, it offers up to six parallel channels. For higher channel count applications, TSP-Link™ provides a solution to connect mainframes in a master-subordinate configuration, effectively allowing them to function as one unit. This facilitates the creation of an optimized source and measurement system suitable for a wide range of applications, from validating design and debugging to complex parallel test systems used in ATE.
Customers can mix and match module configurations to optimize cost, throughput, and accuracy. For applications where low current measurements and sinking capabilities aren’t required, power supplies can be a cost-effective solution. For applications in which true current sourcing and high-speed measurements are required, consider an SMU module. The system supports a wide array of applications, and its high-density design conserves valuable rack space and reduces cost per channel. It’s engineered to deliver fast throughput for high-channel parallel testing, saving both cost and time for production and validation test users.