Keithley 2651A 40V, 50A, 2000W SourceMeter

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Source or sink:–2,000W of pulsed power (±40V, ±50A)–200W of DC power (±10V@±20A, ±20V@±10A, ±40V@±5A)Easily connect two units (in series or parallel) to create solutions up to ±100A or ±80V1pA resolution enables precise measurement of very low leakage currents1us per point (1MHz), 18-bit sampling, accurately characterizes transient behavior1% to 100% pulse duty cycle for pulse width modulated (PWM) drive schemes and device specific drive stimulusCombines a precision power supply, current source, DMM, arbitrary waveform generator, V or I pulse generator with measurement, electronic load, and trigger controller— all in one instrumentIncludes TSP® Express I-V characterization software, LabVIEW® driver, and Keithley’s Test Script Builder software development environment

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Keithley 2651A 40V, 50A, 2000W SourceMeter

The high-power Model 2651A SourceMeter SMU Instrument is specifically designed to characterize and test high power electronics. This SMU instrument can help you improve productivity in applications across the R&D, reliability, and production spectrums, including high brightness LEDs, power semiconductors, DC-DC converters, batteries, solar cells, and other high power materials, components, modules, and subassemblies.
The Model 2651A offers a highly flexible, four-quadrant voltage and current source/load coupled with precision voltage and current meters. It can be used as a:

  • Semiconductor characterization instrument
  • V or I waveform generator
  • V or I pulse generator
  • Precision power supply
  • True current source
  • Digital multimeter (DCV, DCI, ohms, and power with 6½-digit resolution)
  • Precision electronic load

 

Features

Benefits

Highly flexible, four-quadrant voltage and current source/load coupled with precision voltage and current metersOffers best-in-class performance with 6½-digit resolution.
Source or sink (2651A) up to 2,000W of pulsed power (±40V, ±50A) or up to 200W of DC power (±10V@±20A, ±20V@±10A, ±40V@±5A); easily connect two units (in series or parallel) to create solutions up to ±100A or ±80VSupports characterization/testing of power semiconductors, HBLEDs, optical devices, solar cells, and GaN, SiC, and other compound materials and devices. Applications include semiconductor junction temperature characterization; high speed, high precision digitization; electromigration studies; and high current, high power device testing.
Source or sink (2657A) up to 180W of DC or pulsed power (±3000V@20mA, ±1500V@120mA)Provides the high voltage required for power semiconductor device characterization and testing, including GaN, SiC, and other compound materials and devices, breakdown and leakage testing to 3kV, and characterization of sub-millisecond transients.
Built-in web browser based softwareAllows for remote control through any browser, on any computer, from anywhere in the world.
Choice of digitizing or integrating measurement modesSupports characterizing transient and steady-state behavior precisely, including rapidly changing thermal effects.
TSP (Test Script Processing) technologyAllows easy system integration with Model 2657A and Series 2600B models.
TSP-Link channel expansion busEnables multiple 2651As and 2657As and selected Series 2600B SMU instruments to be combined to form an integrated system with up to 32 channels.
Compatible with Model 8010 High Power Device Test Fixture and Model 8020 High Power Interface PanelProvides safe and easy connections for testing high power devices at either the packaged part or wafer level.
Free Test Script Builder software toolHelps you create, modify, debug, and store TSP test scripts.
Optional ACS Basic semiconductor component characterization softwareMaximizes productivity when performing packaged part characterization during development, quality verification, or failure analysis.